SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200032413A1
SERIAL NO

16594088

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for forming a semiconductor structure is disclosed. A substrate is provided. A pad metal and a fuse metal are formed on the substrate. A liner is formed on the pad metal and on the fuse metal. An etching stop layer is formed on the portion of the liner on the fuse metal. A dielectric layer and a passivation layer are formed on the liner and on the etching stop layer. After defining a pad opening and a fuse opening in the passivation layer, a first etching step is performed to remove the dielectric layer from the pad opening and the fuse opening until the pad metal and the etching stop layer are exposed. Afterward, a second etching step is performed to remove the exposed etching stop layer from the fuse opening until the liner on the fuse metal is exposed.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPNO 3 LI-HSIN ROAD 2 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU CITY

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Feng-Yi Tainan City, TW 155 668
Kuo, Ming-Feng Tainan City, TW 30 155
Lee, Fu-Che Taichung City, TW 111 230

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