METHOD FOR EVALUATING QUALITY OF SIC SINGLE CRYSTAL BODY ANDMETHOD FOR PRODUCING SILICON CARBIDE SINGLE CRYSTAL INGOT USING THE SAME

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United States of America

APP PUB NO 20200010974A1
SERIAL NO

16306129

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A method for evaluating the quality of a SiC single crystal by a non-destructive and simple method; and a method for producing a SiC single crystal ingot with less dislocation and high quality with good reproducibility utilizing the same. The method for evaluating the quality of a SiC single crystal body is based on the graph of a second polynomial equation obtained by differentiating a first polynomial equation, the first polynomial equation approximating the relation between a peak shift value and a position of the measurement point and the peak shift value being obtained by an X-ray rocking curve measurement. The method for producing a SiC single crystal ingot manufactures a SiC single crystal ingot by a sublimation recrystallization method using, as a seed crystal, the SiC single crystal body evaluated by the evaluation method.

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Patent Owner(s)

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RESONAC CORPORATIONTOKYO 105-7325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
NAKABAYASHI, Masashi Tokyo, JP 25 239
USHIO, Shoji Tokyo, JP 4 9

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