METHOD FOR IN-SITU MARKERS FOR THERMAL MECHANICAL STRUCTURAL HEALTH MONITORING

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200003639A1
SERIAL NO

16534703

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Abstract

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A method of monitoring the residual stress in surface and near surface regions of a component includes identifying predetermined locations on the surface of a component that are expected to experience high stress during normal operating conditions of the component. Marker particles are introduced into the component during additive manufacture of the component at the predetermined locations. Then, the residual stress of the component is measured at a location corresponding with the marker material using x-ray techniques.

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Patent Owner(s)

Patent OwnerAddress
RAYTHEON TECHNOLOGIES CORPORATION870 WINTER STREET WALTHAM MA 02451

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Butcher, Evan J Suffield, US 20 33
Dautova, Lyutsia Rocky Hill, US 20 413
Hebert, Rainer J Ellington, US 1 0
Ott, Joe Enfield, US 49 721
Schirtzinger, Gary A Glastonbury, US 29 492
Twelves,, JR Wendell V Glastonbury, US 54 628

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