FACILITY INSPECTION SYSTEM AND FACILITY INSPECTION METHOD

Number of patents in Portfolio can not be more than 2000

United States of America

SERIAL NO

16465373

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A facility inspection system prevents a normal part from being detected as an abnormal part caused by a deviation in an alignment due to a presence/absence of a moving object in detecting the abnormal part in a surrounding environment of a vehicle moving on a track. The system includes a photographing device, storage device, separation unit, an alignment unit, and a extraction unit. The photographing device photographs the surrounding environment of the moving vehicle. The storage device stores a reference alignment point cloud and a reference difference-extraction point cloud for each position on the track. The separation unit separates the alignment point cloud from a three-dimensional point cloud. The alignment unit aligns the reference alignment point cloud and the alignment point cloud and outputs alignment information. The extraction unit extracts a difference between the three-dimensional point cloud deformed based on the alignment information and the reference difference-extraction point cloud.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH SOLUTIONS CORPORATIONMINATO-KU TOKYO 105-6412

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHIHARA, Nobuhiro Tokyo, JP 13 76
HONDA, Masahiko Tokyo, JP 50 393
HORIE, Kiyotake Kodama-gun, JP 1 4
KISHI, Toshihide Tokyo, JP 3 35
SHINBO, Masashi Tokyo, JP 1 4

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation