Mask Patterns and Method of Manufacture

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United States of America

SERIAL NO

16018444

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Abstract

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Photomasks and methods of fabricating the photomasks are provided herein. In some examples, a layout for forming an integrated circuit device is received. The layout includes a set of printing features. A region of the layout is identified. The region is at a distance from the set of printing features such that an exposure region associated with a feature in the region does not affect a set of exposure regions associated with the set of printing features. A plurality of non-printing features is inserted into the region. A photomask is fabricated based on the layout.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chia-Jen Hsinchu County, TW 98 1413
Hsueh, Wen-Chang Taoyuan County, TW 12 20
Lee, Hsin-Chang Hsinchu County, TW 203 1090
Lien, Ta-Cheng Hsinchu County, TW 104 198

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