ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION METHOD, AND NON-TRANSITORY RECORDING MEDIUM

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United States of America

SERIAL NO

16479256

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Abstract

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Provided are an abnormality determination device and the like that are able to accurately determine abnormalities regarding an inspection subject. The abnormality determination device is configured to calculate a scatter degree of differences between prediction information on an observation target and observation information on the observation target, the prediction information being an information generated in accordance with a scenario that represents an aspect of state change of the observation target, the observation information generated by an inspection target; and determine whether or not the inspection target is abnormal based on the calculated degree.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATION7-1 SHIBA 5-CHOME MINATO-KU TOKYO 108-8001

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ARAKI, Soichiro Tokyo, JP 28 261
ARIYAMA, Tetsuri Tokyo, JP 26 38
AZUMA, Tan Tokyo, JP 14 12
FUJIYAMA, Kenichiro Tokyo, JP 29 156
SATOH, Mineto Tokyo, JP 28 48

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