METHOD AND SYSTEM FOR DIAGNOSING MALIGNANT MELANOMA USING SCANNING PROBE MICROSCOPE

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United States of America

SERIAL NO

16472232

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Disclosed is a method for determining malignant melanoma by a scanning probe microscope system with a cantilever, which includes: setting locations of a plurality of measurement points to be measured in a sample tissue; applying force in a predetermined range to each measurement point on the sample tissue through the cantilever and acquiring information on a distance between a probe and the sample tissue depending on force for each measurement point; generating a force-distance graph of measurement points based on distance information depending on the force acquired at the plurality of measurement points; and determining whether the sample tissue is malignant melanoma based on characteristics information of the sample tissue extracted from the force-distance graph.

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Patent OwnerAddress
KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATIONSEOUL SOUTH KEREAN SEOUL

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHOI, Eunjung Seoul, KR 6 146
CHOI, Tae Hyun Seoul, KR 6 4
HUANG, Yan Seoul, KR 219 1272
HUR, Woojune Seoul, KR 2 2
JEON, Byoung Jun Seoul, KR 2 0
JO, Seong Jin Seoul, KR 26 343
KIM, Byung Jun Seoul, KR 49 67
KIM, Jungah Ansan-si, KR 11 0
KIM, Youngmin Gimpo-si, KR 244 1832
LEE, Gyudo Namyangju-si, KR 4 0
LEE, Wonseok Incheon, KR 85 1208
PARK, Gee Ho Guri-si, KR 3 0
SHIM, Jung Hee Seoul, KR 6 0
WUFUER, Maierdanjiang Seoul, KR 1 0
YOON, Dae Sung Seoul, KR 10 16

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