METHOD AND APPARATUS FOR GENERATING MEASUREMENT PLAN FOR MEASURING X-RAY CT

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United States of America Patent

APP PUB NO 20190287274A1
SERIAL NO

16299513

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Abstract

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When generating a measurement plan for measuring X-ray CT that performs X-ray irradiation while rotating a test object, and in doing so acquires projection image data, reconstructs volume data from the projection image data, and measures a targeted measurement location in the volume data, the present invention calculates required measurement accuracy and a measurement field of view range based on tolerance information included in CAD data of the test object and a measurement location on the test object defined by a measurement operator ahead of time, and automatically generates, from this information, an optimized measurement plan that minimizes the number of measurements.

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Patent Owner(s)

Patent OwnerAddress
MITUTOYO CORPORATION20-1 SAKADO 1-CHOME TAKATSU-KU KAWASAKI KANAGAWA 213-8533

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ARIGA, Kozo Tokyo, JP 16 273
ASANO, Hidemitsu Kanagawa, JP 19 73
CHO, Gyokubu Kanagawa, JP 19 67
KON, Masato Kanagawa, JP 32 3969

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