MEASURING METHOD AND MEASURING SYSTEM

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United States of America Patent

APP PUB NO 20190277840A1
SERIAL NO

16397705

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of measuring a target substance contained in a sample may include passing a complex formed by allowing the target substance to react with a predetermined carrier through a pore provided in a substrate. A size of the complex may be measured based on change in electrical characteristics occurring when the complex is passed through the pore in the pass-through step. The number of molecules of target substance may be determined based on the size of the complex measured in the measuring step.

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Patent Owner(s)

Patent OwnerAddress
H U GROUP RESEARCH INSTITUTE G K51 KOMIYA-MACHI HACHIOJI-SHI TOKYO 192-0031

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hiki, Shinichiro Tokyo, JP 1 0
MATSUNO, TATSUKI Tokyo, JP 15 29
Oka, Akihiro Tokyo, JP 4 135

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