DEPTH MEASURING METHOD AND SYSTEM
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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N/A
Issued Date -
Aug 29, 2019
app pub date -
Oct 26, 2017
filing date -
Oct 31, 2016
priority date (Note) -
Published
status (Latency Note)
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Abstract
A depth measuring method and system applicable to a first binocular camera having a zoom lens is provided. The method includes: obtaining a current depth of a target object (S101); determining a focus with which the current depth is measured as a current focus (S102); determining, according to the preset correspondence between depth ranges and focuses, a current reference focus corresponding to a current reference depth range; wherein, the current reference depth range is a depth range in which the current depth falls (S103); determining whether the current focus is the same as the current reference focus; (S104); if the current focus is the same as the current reference focus, determining the current depth as the target depth of the target object (S105); or if the current focus is not the same as the current reference focus, adjusting the current focus to the current reference focus, measuring a current depth of the target object with the adjusted current focus (S106), and proceeding to the operation (S103) of determining, according to preset correspondence between depth ranges and focuses, a current reference focus corresponding to a current reference depth range. An object in various depth ranges is measured with a varying focus. The accuracy of the depth measurement of the target object is thus improved.
First Claim
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Family
Country | kind | publication No. | Filing Date | Type | Sub-Type |
---|---|---|---|---|---|
CN | B | CN108020200 | Oct 31, 2016 | Patent | Grant |
Type : Patent Sub-Type : Grant | |||||
GRANTED PATENT FOR INVENTION | Depth measurement method and system | Feb 28, 2020 | |||
EP | B1 | EP3534109 | Oct 26, 2017 | Patent | Grant |
Type : Patent Sub-Type : Grant | |||||
Patent | DEPTH MEASURING METHOD AND SYSTEM | Aug 10, 2022 | |||
WO | A1 | WO2018077218 | Oct 26, 2017 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
INTERNATIONAL APPLICATION PUBLISHED WITH INTERNATIONAL SEARCH REPORT | 一种深度测量方法及系统 | May 03, 2018 |
- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
HANGZHOU HIKVISION DIGITAL TECHNOLOGY CO LTD | NO 555 QIANMO ROAD BINJIANG DISTRICT HANGZHOU ZHEJIANG 310051 |
International Classification(s)

- 2017 Application Filing Year
- H04N Class
- 19055 Applications Filed
- 14406 Patents Issued To-Date
- 75.61 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
MAO, Hui | Zhejiang, CN | 25 | 77 |
# of filed Patents : 25 Total Citations : 77 | |||
PU, Shiliang | Zhejiang, CN | 48 | 165 |
# of filed Patents : 48 Total Citations : 165 | |||
WANG, Jingxiong | Zhejiang, CN | 4 | 15 |
# of filed Patents : 4 Total Citations : 15 |
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Patent Citation Ranking
- 2 Citation Count
- H04N Class
- 36.18 % this patent is cited more than
- 6 Age
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Feb 28, 2027 |
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Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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