Scanning probe microscope combined with a device for acting on a probe and a specimen
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United States of America Patent
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Jun 23, 2020
Grant Date -
Jul 18, 2019
app pub date -
May 18, 2017
filing date -
May 18, 2016
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Abstract
A scanning probe microscope combined with a device for acting on a probe and a specimen relates to measurement technology, more specifically to devices for measuring objects by probe methods after nano-sectioning. Same can be used for studying the structures of biological and polymeric specimens under low-temperature conditions. The aim of the invention is to raise the operating efficiency of elements of the measurement unit of a scanning probe microscope which is combined with a device for acting on a probe and a specimen. The technical result of the invention consists in raising the resolution of the device and the quality of the image, as well as expanding the functional capabilities of the device by examining a broader range of specimens.
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