Optical proximity correction (OPC) method and method of manufacturing mask by using the OPC method
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United States of America Patent
Stats
-
Jun 16, 2020
Grant Date -
Jun 20, 2019
app pub date -
Jul 5, 2018
filing date -
Dec 18, 2017
priority date (Note) -
In Force
status (Latency Note)
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Abstract
An optical proximity correction (OPC) whereby corner rounding may be effectively controlled, and a mask manufacturing method performed using the OPC method are provided. According to the OPC method, an inner edge is generated through decomposition of a layout, and a displacement (DISin_frag) of an inner fragment and a displacement (DISsel) of a selected fragment are calculated based on the inner edge to additionally displace a fragment, so as to manufacture a mask layout with minimized corner rounding without violating mask rule check (MRC).
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SAMSUNG ELECTRONICS CO LTD | SUWON-SI GYEONGGI-DO 16677 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Choi, Da-woon | Hwaseong-si, KR | 1 | 4 |
# of filed Patents : 1 Total Citations : 4 | |||
Kim, Yu-kyung | Suwon-si, KR | 9 | 31 |
# of filed Patents : 9 Total Citations : 31 | |||
Song, Yun-kyoung | Hwaseong-si, KR | 1 | 4 |
# of filed Patents : 1 Total Citations : 4 |
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- 1 Citation Count
- G03F Class
- 48.28 % this patent is cited more than
- 5 Age
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