Optical proximity correction (OPC) method and method of manufacturing mask by using the OPC method

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United States of America Patent

PATENT NO 10684544
APP PUB NO 20190187552A1
SERIAL NO

16027644

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An optical proximity correction (OPC) whereby corner rounding may be effectively controlled, and a mask manufacturing method performed using the OPC method are provided. According to the OPC method, an inner edge is generated through decomposition of a layout, and a displacement (DISin_frag) of an inner fragment and a displacement (DISsel) of a selected fragment are calculated based on the inner edge to additionally displace a fragment, so as to manufacture a mask layout with minimized corner rounding without violating mask rule check (MRC).

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDSUWON-SI GYEONGGI-DO 16677

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Choi, Da-woon Hwaseong-si, KR 1 4
Kim, Yu-kyung Suwon-si, KR 9 31
Song, Yun-kyoung Hwaseong-si, KR 1 4

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  • 1 Citation Count
  • G03F Class
  • 48.28 % this patent is cited more than
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges6476602231122201 - 1011 - 2021 - 3031 - 4041 - 5051 - 6071 - 80100 +050100150200250300350400450500550600650700

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