APPARATUS AND METHOD FOR MEASURING A CHARACTERISTIC OF AN ANALYTE PARTICLE
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United States of America Patent
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Issued Date -
Jun 13, 2019
app pub date -
Dec 10, 2018
filing date -
Dec 8, 2017
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Abstract
An apparatus and a method are disclosed for measuring a characteristic of an analyte particle. An apparatus for measuring a characteristic of an analyte particle includes a heat flux sensor configured to be maintained at a temperature. The heat flux sensor includes first and second electrical connections, and a top interconnect membrane bridging the first and second electrical connections. The apparatus further includes an emitter configured to eject an analyte particle to cause the analyte particle to collide with the top interconnect membrane of the heat flux sensor.
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