SYSTEM AND METHOD FOR BINNING AT FINAL TEST
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United States of America Patent
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May 30, 2019
app pub date -
Oct 24, 2018
filing date -
Oct 24, 2018
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Abstract
Systems and methods for sorting an electronic device undergoing a final test operation in accordance with a test program, into one of a plurality of bins. In one embodiment, an evaluator defines the binning of the electronic device while the device is still socketed, and the defined binning may or may not concur with the binning assigned by the test program.
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