Method of acquiring holograms by off-axis electron holography in precession mode
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United States of America Patent
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Jan 5, 2021
Grant Date -
May 23, 2019
app pub date -
Nov 20, 2018
filing date -
Nov 22, 2017
priority date (Note) -
In Force
status (Latency Note)
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Abstract
Method for acquisition of at least one hologram of a sample by off-axis holography using a transmission electron microscope, the microscope comprising an electron beam source, at least one objective lens, a sample holder, at electron biprism and means of displacing the electron beam in precession mode upstream from the sample holder and a compensator of the precession downstream from the sample holder, said method comprising the activation of means of displacing the electron beam in precession mode and the compensator and acquisition of a hologram of said sample in precession mode.
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Patent Citation Ranking
- 1 Citation Count
- H01J Class
- 59.47 % this patent is cited more than
- 4 Age
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