TESTING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE
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United States of America Patent
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May 9, 2019
app pub date -
Jun 1, 2018
filing date -
Jun 1, 2018
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Abstract
A testing apparatus includes a test head body, a test board coupled to the test head body, and a spring pin block coupled to a lower portion of the test board. The testing apparatus further includes a magnetic field generator penetrating through each of the test head body, the test board, and the spring pin block.
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