Method of locally imaging a structure in a sample at high spatial resolution in order to detect reactions of an object of interest to altered environmental conditions

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United States of America Patent

PATENT NO 10955348
APP PUB NO 20190011367A1
SERIAL NO

16123280

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Abstract

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For high spatial resolution imaging a structure marked with luminescence markers, light that has an effect on the emission of luminescence light by the luminescence markers is directed onto a sample with an intensity distribution having a central zero point. Scan areas of the sample are scanned with the zero point. Luminescence light emitted out of a local area including the zero point is registered and assigned to the respective location of the zero point in the sample. Several copies of an object of interest are arranged in the scan areas and subjected to varying surrounding conditions. The individual scan areas are scanned with the respective zero point at least two times at two different stages of reactions to the varying surrounding conditions. Dimensions of the scan areas are limited such that they are not larger than 75% of a distance of intensity maxima delimiting the zero point.

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Patent Owner(s)

Patent OwnerAddress
MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E VHOFGARTENSTRASSE 8 MUNICH 80539

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Goettfert, Fabian Goettingen, DE 2 23
Hell, Stefan W Goettingen, DE 33 232
Westphal, Volker Hannover, DE 11 923

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  • 3 Citation Count
  • G01N Class
  • 67.96 % this patent is cited more than
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges6401289574341211101 - 1011 - 2021 - 3031 - 4051 - 6061 - 7071 - 8005001000150020002500300035004000450050005500600065007000

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