A METHOD TO MEASURE NANOSCALE MECHANICAL PROPERTIES USING ATOMIC FORCE MICROSCOPY WITHOUT INITIALLY CHARACTERIZING CANTILEVER TIP GEOMETRY
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United States of America Patent
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Dec 20, 2018
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Dec 8, 2016
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Dec 8, 2016
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The atomic force microscope has evolved from purely a qualitative apparatus that measures the topography of a sample into a quantitative tool that also measures mechanical properties of a sample at the nanoscale. Prior technologies that attempt to measure the bulk parameters must characterize the geometry of the atomic force microscope cantilever tip in a separate experiment before being able to measure the mechanical properties of the sample. This is the single biggest obstruction to the accuracy and expediency of quantitative atomic force microscopy methodologies. Present techniques are also unable to probe the full set of viscoelastic properties of a material as they do not include any method to measure the damping of samples. We propose a method herein that simultaneously circumvents the need for a separate experiment to characterize the tip geometry and measures the full set of viscoelastic properties of a material.
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