PHASE-SHIFT BLANKMASK AND PHASE-SHIFT PHOTOMASK

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United States of America Patent

APP PUB NO 20180335692A1
SERIAL NO

15975297

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Abstract

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Disclosed are a phase-shift blankmask and a phase-shift photomask, which includes a phase-shift film made of silicon (Si) or a silicon (Si) compound on a transparent substrate and has a high transmittance characteristic. In the phase-shift blankmask according to the present disclosure, the phase-shift film has a high transmittance of 50% or higher, thereby achieving a micro pattern smaller than or equal to 32 nm, preferably 14 nm, and more preferably 10 nm for a semiconductor device, for example, a DRAM, a flash memory, a logic device.

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Patent Owner(s)

Patent OwnerAddress
S&S TECH CO LTDSOUTH KOREA DAEGU WAN CITY DARCY DISTRICT FOX FOREST CAVE 9 TIMES

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KIM, Chang-Jun Daegu-si, KR 8 18
KONG, Gil-Woo Daegu-si, KR 8 8
LEE, Jong-Hwa Daegu-si, KR 104 1238
NAM, Kee-Soo Daegu-si, KR 20 176
SHIN, Cheol Daegu-si, KR 96 405
SHIN, Seung-Hyup Daegu-si, KR 7 7
YANG, Chul-Kyu Daegu-si, KR 25 37

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