Shielded probe tip interface
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United States of America Patent
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Aug 25, 2020
Grant Date -
Nov 15, 2018
app pub date -
Aug 25, 2017
filing date -
May 10, 2017
priority date (Note) -
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status (Latency Note)
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Abstract
Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The socket includes a concavity to receive a signal pin. The probe tip also comprises a reference body of conductive material surrounding the socket. The probe tip further comprises a insulating spacer element of non-conductive material surrounding the reference body at the proximate end of the probe tip. The insulating spacer element includes a signal port to receive the signal pin into the socket. The insulating spacer element further includes a reference port to receive a reference pin and maintain the reference pin in electrical communication with a proximate end of the reference body.
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