Radiation Analyzing Apparatus

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United States of America Patent

APP PUB NO 20180275079A1
SERIAL NO

15928807

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The radiation analyzing apparatus irradiates an object including a plurality of elements with a first radiation, detects a plurality of rays of a second radiation emitted from the object irradiated with the first radiation, derives an energy spectrum based on a signal of each of the plurality of rays of the second radiation, detects detection energy, which is energy absorbed in a reference element that is an element used as a reference or is energy emitted from the reference element, based on the energy spectrum, and corrects the energy spectrum based on reference energy information, which is previously stored in a storage unit and indicates reference energy that is energy absorbed in the reference element or is energy emitted from the reference element, and the detection energy.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH SCIENCE CORPORATION24-14 NISHI-SHIMBASHI 1-CHOME MINATO-KU TOKYO 105-0003

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chinone, Kazuo Tokyo, JP 16 72
Tanaka, Keiichi Tokyo, JP 226 4320

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