X-ray microscope

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United States of America Patent

PATENT NO 11189392
APP PUB NO 20180261352A1
SERIAL NO

15759922

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Abstract

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An X-ray microscope includes at least one of an X-ray source, a sample holding part, a concave Kirkpatrick-Baez mirror, a convex Kirkpatrick-Baez mirror, and a light receiving part located at a position in an imaging relation to a position of the sample holding part in this order along an optical axis.

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Patent Owner(s)

Patent OwnerAddress
OSAKA UNIVERSITY1-1 YAMADAOKA SUITA-SHI OSAKA 5650871

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Matsuyama, Satoshi Osaka, JP 8 61
Yamada, Jumpei Osaka, JP 2 35

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