DEVICE AND COMPONENTS OVERHEATING EVALUATION
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United States of America Patent
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Issued Date -
Aug 2, 2018
app pub date -
Jan 31, 2018
filing date -
Feb 2, 2017
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Abstract
A method for measuring temperature of a device includes measuring temperatures for each of a plurality of components or zones of the device and combining the temperatures measured into a device total temperature. A system for measuring temperature of a device includes a processor and a non-transitory memory component operatively coupled with the processor. The non-transitory memory component has, recorded thereto, computer readable instructions configured to cause the processor to measure temperatures for each of a plurality of components or zones of the device and combine the temperatures measured into a device total temperature.
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