Statistical analysis in X-ray imaging
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United States of America Patent
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-
Jun 16, 2020
Grant Date -
Jul 19, 2018
app pub date -
Jan 16, 2017
filing date -
Jan 16, 2017
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A method of analyzing a specimen using X-rays, comprising the steps of:
- Irradiating the specimen with input X-rays;Using a detector to detect a flux of output X-rays emanating from the specimen in response to said irradiation,which method further comprises the following steps:Using the detector to intercept at least a portion of said flux so as to produce a set {Ij} of pixeled images Ij of at least part of the specimen, whereby the cardinality of the set {Ij} is M>1.For each pixel pi in each image Ij, determining the accumulated signal strength Sij, thus producing an associated set of signal strengths {Sij}.Using the set {Sij} to calculate the following values: A mean signal strength S per pixel position i;A variance σ2S in S per pixel position i. Using these values S and σ2S to produce a map of mean X-ray photon energy E per pixel.
First Claim
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International Classification(s)
- 2017 Application Filing Year
- G21K Class
- 261 Applications Filed
- 176 Patents Issued To-Date
- 67.44 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G21K Class
- 43.75 % this patent is cited more than
- 5 Age
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|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Dec 16, 2027 |
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