SYSTEM AND METHOD FOR GENERATION OF INTEGRATED TEST SCENARIOS

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United States of America Patent

SERIAL NO

15450910

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Abstract

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This disclosure relates to generating integrates test scenarios. The method includes creating a test process model comprising a plurality of processes and one or more interaction paths amongst the plurality of processes based on business process information; identifying a plurality of test scenarios based on an analysis of the plurality of processes and the one or more interaction paths amongst the plurality of processes, wherein each of the plurality of test scenarios comprises a unique process flow path; determining a risk weight and a criticality weight associated with each of the plurality of test scenarios; and identifying at least one test scenario from the plurality of test scenarios based on a comparison of the risk weight and the criticality weight determined for each of the plurality of test scenarios with an associated threshold weight.

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Patent Owner(s)

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WIPRO LIMITED560 035 KARNATAKA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Asha, Shaik Chennai, IN 2 6
Choudam, Hemantha Kumar Bangalore, IN 4 37
Nagaraja, Selvan Bangalore, IN 4 12
Narayan, Ganesh Bangalore, IN 12 186

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