METHODS FOR PRODUCING DIAMOND GRITS FOR A WAFER SLICING SYSTEM

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United States of America Patent

SERIAL NO

15857831

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Abstract

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A method for producing diamond grits for use in a wafer slicing system includes adjusting an initial diamond size distribution until an intermediate diamond size distribution is generated. The intermediate diamond size distribution has a corresponding simulated penetration thickness value less than or equal a predetermined penetration thickness value, and penetration thickness is a parameter proportional to a depth of subsurface damage that would occur when slicing an ingot using a diamond coated wire having an associated diamond size distribution. The method may include adjusting the intermediate diamond size distribution until a final diamond size distribution is generated, wherein the final diamond size distribution has a maximum diamond grit size that is substantially equal to a predetermined maximum diamond grit size, and manufacturing the diamond coated wire such that the diamond coated wire has a plurality of diamond grits that fit the final diamond size distribution.

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Patent Owner(s)

Patent OwnerAddress
CORNER STAR LIMITEDUNIT 1703B - 1706 LEVEL 17 INTERNATIONAL COMMERCE CENTRE 1 AUSTIN ROAD WEST KOWLOON

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Calvin, Edward Grafton, US 12 16
Nandan, Rituraj O'Fallon, US 6 1
Rezvanian, Omid Chesterfield, US 3 1
Shive, Larry St. Charles, US 1 1
Witte, Dale A Wentzville, US 13 97

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