Light Emission Measuring Device
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United States of America Patent
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Apr 30, 2015
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Apr 30, 2015
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The present disclosure relates to measuring light emission. The teachings thereof may be embodied in emission-measuring devices. For example, a device may include: a sample region; an illumination unit for irradiating the sample region and a sample positioned therein; and a radiation detector. The illumination unit may include: a radiation source; a first dispersive element arranged downstream, decomposing the radiation into spectral components; a first micromirror field arranged downstream; and a second dispersive element arranged downstream of the first micromirror field. The second dispersive element may unify spectral components selected by the first micromirrror field into a common excitation beam.
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