OPTICAL MEASUREMENT METHOD AND OPTICAL MEASUREMENT APPARATUS

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United States of America Patent

SERIAL NO

15677606

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Abstract

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There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.

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Patent Owner(s)

Patent OwnerAddress
OTSUKA ELECTRONICS CO LTDJAPAN'S OSAKA TIAN RECRUIT MENTION HIRAKATA LAST THREE 26 TIMES 3 CHOME HIRAKATA-SHI OSAKA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
INOUE, Nobuyuki Kyoto-shi, JP 16 161
NAGASHIMA, Taku Kusatsu-shi, JP 1 1

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