MANUFACTURE METHOD OF N TYPE THIN FILM TRANSISTOR

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United States of America Patent

SERIAL NO

15119383

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Abstract

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The present invention provides a manufacture method of a N type thin film transistor. In the manufacture process, the chemical solution is employed to etch the channel region of the N type thin film transistor to raise a surface roughness of the low temperature polysilicon in the channel region of the N type thin film transistor, and thus to raise the surface defect density of the low temperature polysilicon in the channel region of the N type thin film transistor. Then, the threshold voltage of the manufactured N type thin film transistor moves toward the positive direction to ensure that the manufactured N type thin film transistor can be closed in time under the low voltage. The production efficiency is high and the production cost is low.

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Patent Owner(s)

Patent OwnerAddress
WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTDBUILDING C5 BIOLOGICAL CITY NO 666 GAOXIN AVENUE DONGHU DEVELOPMENT ZONE WUHAN CITY HUBEI PROVINCE WUHAN CITY HUBEI PROVINCE 430079

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yu, Xiaojiang Wuhan City, CN 25 114

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