METHOD FOR MANUFACTURING THIN SiC WAFER AND THIN SiC WAFER

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United States of America Patent

SERIAL NO

15812293

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Abstract

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Provided is a method for manufacturing a thin SiC wafer by which a SiC wafer is thinned using a method without generating crack or the like, the method in which polishing after adjusting the thickness of the SiC wafer can be omitted. The method for manufacturing the thin SiC wafer 40 includes a thinning step. In the thinning step, the thickness of the SiC wafer 40 can be decreased to 100 μm or less by performing the Si vapor pressure etching in which the surface of the SiC wafer 40 is etched by heating the SiC wafer 40 after cutting out of an ingot 4 under Si vapor pressure.

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Patent Owner(s)

Patent OwnerAddress
TOYO TANSO CO LTDOSAKA JAPAN OSAKA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KITABATEKE, MAKOTO Kanonji-shi, JP 1 1
NOGAMI, SATORU Kanonji-shi, JP 43 346
SHINOHARA, MASATO Kanonji-shi, JP 9 22
TERAMOTO, YOUJI Kanonji-shi, JP 6 26
TORIMI, SATOSHI Kanonji-shi, JP 19 51
YABUKI, NORIHITO Kanonji-shi, JP 16 40

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