METHOD AND APPARATUS FOR ENHANCED MODELING AND ANALYSIS OF MATERIALS

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United States of America Patent

SERIAL NO

15551976

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Abstract

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A method, apparatus, and computer readable medium are provided for modeling of materials and visualization of properties of the materials. An example method includes receiving data describing a set of properties of a material, and computing, by a processor and based on the received data, geometric features of the material. The example method further includes extracting, by the processor, particle paths within the material based on the computed geometric features, and geometrically modeling, by the processor, the material using the geometric features and the extracted particle paths. The example method further includes generating, by the processor and based on the geometric modeling of the material, one or more visualizations regarding the material, and causing display, by a user interface, of the one or more visualizations.

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Patent Owner(s)

Patent OwnerAddress
KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY4700 KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY THUWAL 23955-6900

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aboulhassan, Amal Thuwal, SA 1 2
Hadwiger, Markus Thuwal, SA 1 2

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