Contact force testing apparatus, use of such a contact force testing apparatus and method for producing such a contact force testing apparatus
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United States of America Patent
Stats
-
Aug 25, 2020
Grant Date -
Mar 8, 2018
app pub date -
Apr 22, 2016
filing date -
Apr 30, 2015
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A contact force testing apparatus includes a measuring sensor that can be contacted with an electrical contact element and measures a contact force (F) of a contact with the electrical contact element. The measuring sensor includes piezoelectric material that receives the contact force (F) in a contact region and produces polarization charges. The measuring sensor includes an acceptor electrode that is completely surrounded by piezoelectric material in the contact region in the direction of a thickness extension of the measuring sensor and receives the polarization charges. A method is provided for the use of such a contact force testing apparatus, and a method is provided for producing such a contact force testing apparatus.
First Claim
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International Classification(s)
- 2016 Application Filing Year
- H01L Class
- 27971 Applications Filed
- 23507 Patents Issued To-Date
- 84.05 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 0 Citation Count
- H01L Class
- 0 % this patent is cited more than
- 5 Age
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