Conformance test artifact for coordinate measuring machine
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United States of America Patent
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May 12, 2020
Grant Date -
Mar 1, 2018
app pub date -
Aug 31, 2017
filing date -
Sep 1, 2016
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Abstract
A test artifact for a coordinate measuring machine includes a calibrated standard and a convex background illumination surface. The calibrated standard, the convex background illumination surface and a vision sensor are positionable relative to one another so as to create a silhouette of the calibrated sphere in the vision sensor's field of view. The test artifact may thus be used to calibrate the coordinate measuring machine, and/or to assess the associativity between the vision sensor and another measuring sensor.
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