SCANNING ELECTROCHEMICAL MICROSCOPY WITH OSCILLATING PROBE TIP
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United States of America Patent
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Mar 29, 2017
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Apr 16, 2010
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Abstract
A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.
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