X-ray diffraction apparatus

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United States of America Patent

PATENT NO 10900913
APP PUB NO 20180052121A1
SERIAL NO

15668746

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Abstract

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An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector is installed on the counter arm, and a plate-like X-ray shielding member that is installed on the counter arm and rotated together with the X-ray detector.

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Patent Owner(s)

Patent OwnerAddress
RIGAKU CORPORATION3-9-12 MATSUBARA-CHO AKISHIMA-SHI TOKYO 196-8666

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Osakabe, Takeshi Tokyo, JP 10 53
Ozawa, Tetsuya Tokyo, JP 41 274

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