Magnetostrictive path measuring apparatus and method of manufacturing a measuring probe of a magnetostrictive path measuring apparatus
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United States of America Patent
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May 26, 2020
Grant Date -
Feb 22, 2018
app pub date -
Aug 2, 2017
filing date -
Aug 5, 2016
priority date (Note) -
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Abstract
A magnetostrictive displacement measuring apparatus is proposed, comprising at least one measuring probe which is of flexurally flexible configuration and comprises a waveguide, and comprising a magnetic position marker which couples to the at least one measuring probe in a non-contact manner, wherein the waveguide is supported in an elastic, flexible support tube and the flexible support tube is positioned in a carrier tube, wherein the flexible support tube is, on an outer side thereof, provided with indentations facing the carrier tube and wherein material of the carrier tube is arranged in the indentations.
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