MEASUREMENT SYSTEM AND METHOD FOR CONFIGURING THE MEASUREMENT SYSTEM
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Aug 16, 2017
filing date -
Aug 17, 2016
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
Measurement system for the three-dimensional optical measurement of a work-piece, comprising: (i) a camera for recording image data of the workpiece; (ii) a control unit which is configured to evaluate the image data recorded by the camera and deter-mine 3D data of the workpiece therefrom; and (iii) a projector for projecting a test pattern onto the workpiece. The control unit is configured to control the projector during a setup mode in such a way that the projector actively modifies, depending on a distance between the workpiece and the camera, the shape of the test pattern projected onto the workpiece in order, by way of the test pattern, to assist a user of the measurement system within the scope of positioning the camera relative to the workpiece.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully