Measurement by means of atomic interferometry with multiple species of atoms
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United States of America Patent
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Oct 2, 2018
Grant Date -
Feb 8, 2018
app pub date -
Feb 10, 2016
filing date -
Feb 16, 2015
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Abstract
Disclosed is a method for measuring an external parameter by atomic interferometry using two sets of atoms that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results. Constant phase shifts that appear in the atomic interferences for the two atom sets are quadrature-adjusted in order to ensure that one of the two measurements provides a value for the external parameter with satisfactory accuracy.
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