MEANS AND METHOD OF MAGNETIC RESONANCE IMAGING OF SAMPLES AND PROCESSES AT HIGH TEMPERATURES AND HIGH PRESSURES

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United States of America Patent

SERIAL NO

15228464

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Abstract

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MRI/NMR systems, devices and modules thereof for T1/T2 analysis; FT spectroscopy; CW spectroscopy and 2D/3D imaging of samples, process and reactions at high temperatures and/or high pressures, comprising active and/or passive thermal insulating means as described in the description and figures.

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Patent Owner(s)

Patent OwnerAddress
ASPECT IMAGING LTD27 HASHAKED STREET INDUSTRIAL AREA HEVEL MODI'IN SHOHAM 6085001

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BARUCHI, Itay Tel Aviv, IL 13 87
COHEN, Tal Herzlia, IL 70 1565
RAPOPORT, Uri Moshav Ben Shemen, IL 195 5096

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