Image sensor with test circuit

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United States of America Patent

PATENT NO 10616571
SERIAL NO

15661486

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Abstract

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An image sensor includes a pixel array, an analog-to-digital converter (ADC), and a test circuit. The pixel array includes a plurality of pixels arranged in rows and columns. Each pixel generates an analog signal based on incident light. The ADC converts the analog signal to a digital signal using a counter. The test circuit receives a test code in a test mode, generates a count clock signal based on the test code, tests a counting operation of the counter according to the count clock signal, and externally outputs a test result of the counter through a test terminal.

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Patent Owner(s)

  • SAMSUNG ELECTRONICS CO., LTD.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chae, Hee-sung Seoul, KR 10 55
Kim, Dah-som Ansan-si, KR 2 13
Kim, Yun-hong Hwaseong-si, KR 6 39

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