Method and system to calibrate phase supported by factory trim data

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United States of America Patent

PATENT NO 9887832
SERIAL NO

15225782

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Abstract

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The present invention provides for a method and system to compensate phase offset caused by the IC (integrated circuit) by making use of factory measurement stored as trim-data in the IC. In the final customer product, the trim-data is mapped to the actual platform environment such that the respective phase offset can be compensated.

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Patent Owner(s)

Patent OwnerAddress
NXP B VHIGHTECH CAMPUS 60 EINDHOVEN 5656AG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hueber, Gernot Linz, AT 32 239
Macnamara, Ian Thomas Graz, AT 22 104

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