CIRCUIT TECHNIQUE TO TRACK CMOS DEVICE THRESHOLD VARIATION
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United States of America Patent
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Sep 20, 2016
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Jul 26, 2016
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Methods and systems for independently tracking NMOS device process variation and PMOS device process variation are described herein. In one embodiment, a method for tracking process variation includes measuring a frequency of an NMOS-based ring oscillator on a chip, and determining a threshold voltage or switching speed for NMOS transistors on the chip based on the measured frequency of the NMOS-based ring oscillator. The method also includes measuring a frequency of a PMOS-based ring oscillator on the chip, and determining a threshold voltage or switching speed for PMOS transistors on the chip based on the measured frequency of the PMOS-based ring oscillator.
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