Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium

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United States of America Patent

PATENT NO 10720324
APP PUB NO 20180033607A1
SERIAL NO

15656862

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Abstract

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A method of manufacturing a semiconductor device is provided. The method includes forming a film on a substrate by causing a first precursor and a second precursor to intermittently react with each other by repeating a cycle a plurality of times, the cycle alternately performing supplying the first precursor, which satisfies an octet rule and has a first pyrolysis temperature, to the substrate and supplying the second precursor, which does not satisfy the octet rule and has a second pyrolysis temperature lower than the first pyrolysis temperature, to the substrate. In the act of forming the film, a supply amount of the first precursor is set larger than a supply amount of the second precursor.

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Patent Owner(s)

Patent OwnerAddress
KOKUSAI ELECTRIC CORPORATION3-4 KANDAKAJI-CHO CHIYODA-KU TOKYO 101-0045

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ashihara, Hiroshi Toyama, JP 76 2625
Harada, Kazuhiro Toyama, JP 68 2189
Karasawa, Hajime Toyama, JP 25 601
Nakatani, Kimihiko Toyama, JP 72 1449

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