Surface Analysis Systems and Methods of Identifying Visible Surfaces Using the Same
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United States of America Patent
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Feb 1, 2018
app pub date -
Jul 27, 2016
filing date -
Jul 27, 2016
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Abstract
A surface analysis system includes a sensor for generating data regarding a location of an object, one or more processors, and one or more memory modules. The surface analysis system measures a plurality of head locations of a head of an observer within an observation environment during an observation period using the sensor. The one or more surfaces are positioned in the observation environment. Further, the surface analysis system identifies one or more visible surfaces of the one or more surfaces positioned in the observation environment based on the plurality of head locations measured during the observation period. Moreover, the one or more visible surfaces include at least one of the one or more surfaces positioned in the observation environment and the one or more visible surfaces are positioned unobstructed from at least one head location of the observer measured during the observation period.
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