MPC with unconstrained dependent variables for KPI performance analysis
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United States of America Patent
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Jul 28, 2016
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Jul 28, 2016
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Abstract
A method of Key Performance Indicator (KPI) performance analysis and a dynamic Model Predictive Control (MPC) process model for an industrial process including measured variables (MVs) and controlled variables (CVs) for an MPC controller are provided. The MPC process model includes at least one KPI that is also included in a business KPI monitoring system for the industrial process. A future trajectory of the KPI and a steady-state (SS) value for the KPI are estimated. The future trajectory and SS value are used for determining dynamic relationships between key plant operating variables selected from the CVs and MVs, and the KPI. A performance of the KPI is analyzed including identifying at least one cause of a problem in the performance or exceeding the performance during operation of the industrial process from the dynamic relationships and a current value for at least a portion of the MVs.
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