Method and device for inspecting defect of liquid crystal panel

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United States of America Patent

PATENT NO 10401659
APP PUB NO 20180031876A1
SERIAL NO

15650390

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Abstract

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The present disclosure provides a method and a device for inspecting a defect of a liquid crystal panel. The method includes steps of: performing AOI treatment on an image of the liquid crystal panel; determining a plurality of to-be-treated targets that do not meet a defect specification requirement in accordance with an AOI treatment result; ranking the plurality of to-be-treated targets in a predetermined order, and acquiring an aggregation degree parameter of every two adjacent to-be-treated targets of the ranked to-be-treated targets; comparing each aggregation degree parameter with a predetermined aggregation degree parameter to acquire a plurality of comparison results; and determining, in accordance with the plurality of comparison results, the to-be-treated targets corresponding to n consecutive aggregation degree parameters smaller than the predetermined aggregation degree parameter as aggregate-type defects of the liquid crystal panel, n being a natural number and greater than or equal to a predetermined value.

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Patent Owner(s)

Patent OwnerAddress
BOE TECHNOLOGY GROUP CO LTDNO 10 JIUXIANQIAO RD CHAOYANG DISTRICT BEIJING 100015
BEIJING BOE DISPLAY TECHNOLOGY CO LTDNO 118 JINGHAIYILU BDA BEIJING 100176

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bian, Zheng Beijing, CN 18 22
Chen, Siyang Beijing, CN 3 5
Liang, Kaijie Beijing, CN 1 3
Liu, Jie Beijing, CN 812 14130
Liu, Shuyuan Beijing, CN 9 48
Su, Jianbing Beijing, CN 5 9
Sun, Tongbo Beijing, CN 6 11

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