Spectacle wearing parameter measurement system, measurement program, measurement method thereof, and manufacturing method of spectacle lens

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United States of America Patent

PATENT NO 10955690
APP PUB NO 20180031868A1
SERIAL NO

15547953

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Abstract

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To perform measurement in which a load on a subject is reduced. To provide a spectacle wearing parameter measurement system including: an information processing unit configured to associate a size of an appearance of at least a part of actual spectacles with a size of an appearance of at least a part of each of the spectacles in an imaging result of imaging a subject wearing the actual spectacles as an imaging target, and obtain a spectacle wearing parameter from the imaging result and the related art of the system.

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Patent Owner(s)

Patent OwnerAddress
HOYA LENS THAILAND LTD853 PHAHOLYOTHIN ROAD PRACHATIPAT THANYABURI PATHUMTHANI 12130

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirono, Naoya Tokyo, JP 3 7
Matsushima, Masaaki Tokyo, JP 31 354
Tadokoro, Nobuyuki Tokyo, JP 8 8

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