Test board for semiconductor package, test system, and method of manufacturing semiconductor package

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 10088521
APP PUB NO 20180031629A1
SERIAL NO

15455550

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Abstract

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A test board includes: a board substrate; a device under test (DUT) socket connected to the board substrate and configured to accommodate a semiconductor package; a test controller; a wireless signal unit configured to wirelessly exchange signals with a server; and a wireless power unit configured to be wirelessly charged by an external source and configured to supply electric power to the test controller and the DUT socket, wherein the test controller is configured to independently perform a test on the semiconductor package accommodated in the DUT socket in response to a test pattern command being wirelessly received from the server via the wireless signal unit.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRIC CORPORATION129 SAMSUNG-RO YEONGTONG-GU GYEONGGI-DO SUWON-SI 16677

International Classification(s)

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  • 2017 Application Filing Year
  • H02J Class
  • 5376 Applications Filed
  • 3962 Patents Issued To-Date
  • 73.70 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Choi, Woon-sup Asan-si, KR 5 18
Lee, Moon-ho Asan-si, KR 5 21
Shin, Seong-seob Asan-si, KR 2 13
Yun, Joo-sung Asan-si, KR 3 9

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  • 3 Citation Count
  • H02J Class
  • 22.71 % this patent is cited more than
  • 7 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges139417381151101 - 1011 - 2021 - 3031 - 4041 - 5051 - 600255075100125150175200225250275300325350375400425450

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