ELECTRICAL CHARACTERISTIC MEASUREMENT APPARATUS, ELECTRICAL CHARACTERISTIC MEASUREMENT SYSTEM, ELECTRICAL CHARACTERISTIC MEASUREMENT METHOD, AND PROGRAM FOR ELECTRICAL CHARACTERISTIC MEASUREMENT FOR CAUSING COMPUTER TO IMPLEMENT THE METHOD

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United States of America Patent

SERIAL NO

15550192

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A technology is provided that enables high accuracy electrical measurement regardless of the performance and/or the like of a measurement device.

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Patent Owner(s)

Patent OwnerAddress
SONY CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hidaka, Isao Tokyo, JP 25 182

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