Non-linear frequency scan optical frequency-domain reflectometry having a processor to estimate a backscattering profile of an optical fiber by applying a predefined function to a beat signal
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United States of America Patent
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Jun 25, 2019
Grant Date -
Feb 1, 2018
app pub date -
Mar 13, 2016
filing date -
Mar 15, 2015
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Abstract
A system (20) for fiber-optic reflectometry includes an optical source (28, 40), a beat detection module (44, 48, 52, 56A, 56B) and a processor (36). The optical source is configured to generate a non-linearly-scanning optical interrogation signal having an instantaneous optical frequency that is a non-linear function of time. The beat detection module is configured to transmit the optical interrogation signal into an optical fiber (24), to receive from the optical fiber an optical backscattering signal in response to the optical interrogation signal, and to mix the optical backscattering signal with a reference replica of the optical interrogation signal, so as to produce a beat signal. The processor is configured (i) to hold a predefined function that is indicative of an expected phase of the beat signal resulting from the non-linearly-scanning optical interrogation signal as a function of position along the optical fiber and time, (ii) to estimate a backscattering profile of the optical fiber by applying the predefined function to the beat signal, and (iii) to sense one or more events affecting the optical fiber by analyzing the backscattering profile.
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